Table 2.

The analytical results of a driver IC process.

Item	$US{L}_j$	$LS{L}_j$	${\overline{\overline{X}}}_j$	${\overline{s}}_j$	${\widehat{Q}}_{\mathit{puj}}$	$L{Q}_{\mathit{puj}}$	$U{Q}_{\mathit{puj}}$	${\widehat{C}}_{\mathit{plj}}$	$L{Q}_{\mathit{plj}}$	$U{Q}_{\mathit{plj}}$	$L{S}_{\mathit{pkj}}$	USpkj
A*	105	85	97.0	8.8	2.73	2.43	3.033	4.08	3.66	4.503	0.889	1.079
B	70	40	52.7	12.4	4.17	3.741	4.602	3.06	2.73	3.39	0.981	1.191
C*	75	65	69.1	4.4	4.02	3.606	4.44	2.79	2.484	3.096	0.905	1.098
D*	35	25	29.4	4.8	3.51	3.141	3.882	2.76	2.457	3.063	0.886	1.084
E*	300	200	253	51	2.76	2.457	3.063	3.12	2.787	3.456	0.863	1.067
F	135	85	108	22	3.69	3.306	4.077	3.15	2.814	3.489	0.992	1.216
Lower confidence interval for the integrated product									$L{S}_{\mathit{pk}}^T$ $=$ 0.9626
Upper confidence interval for the integrated product									$U{S}_{\mathit{pk}}^T$ $=$ 0.9977