Figure 2.

Traced lateral X-ray for Geometric morphometric analysis. 12 curves and 90 landmarks, of which 74 were semilandmarks and 16 were fixed landmarks were used for morphometric analysis. The fixed landmarks are the most posterior-superior point on the mandibular condyle (Co), the most posterior point of the angular process of the mandible (Go), the point on the most inferior contour of the angular process of the mandible (Go’), most prominent point between incisal edges of lower incisors (il), most prominent point between incisal edges of upper incisors (iu), most posterior point of lower molars (LMP), most anterior point of lower molars (LMA), the most inferior-anterior point of the lower border of the mandible (Me), the most posterior point of squama occipitalis (Oc), the most superior point of parietal bone (Pa), the internal curvature of the frontal bone (pfs), the point corresponding to anatomic porium (Po), The deepest point of the nasopremaxillary suture (R), the most inferior point of tympanic bone (T), the most posterior edge of the alveolar bone on the convexity of the upper incisors (i) and the most inferior-anterior point on the alveolar process of premaxilla (sd).