Table 6.

Computerised cognitive test battery

Test	Description	Adaptation of
Memory span I: Digit span, unsorted (‘Zahlen merken – unsortiert’)	Rows of single digit numbers are presented (each for 1 s); the numbers must be reproduced immediately afterwards	WAIS-IV80, task Digit Span
Memory span II: Digit span, ascending (‘Zahlen merken – aufsteigend’)	Like Memory span I; numbers must be reproduced in ascending order	WAIS-IV80, task Digit Span
Processing speed I: No Comparison (‘Zahlen vergleichen’)	Comparison of two single-digit numbers separated by a horizontal line (participants should react if same no)	Pattern Comparison\Letter Comparison81
Processing speed II: Symbol count (‘Symbole zählen’)	Counting a target symbol in a pool as fast as possible	SKT82, task ‘counting symbols’
Processing speed III: Numerical Stroop task (‘numerischer Stroop-Test’)	Two single-digit numbers are presented in different sizes (congruent/incongruent mixed); no with higher value must be clicked as quickly as possible	Numerical stroop task83 84
Short term memory I: Free recall (‘Wortliste – Erinnern’)	12 objects have to be named; afterwards shown for 1 min; some tests later, the objects must be remembered	SKT82, task ‘delayed recall’
Short term memory II: Cued recall (‘Wortliste – erkennen’)	The objects from Short term memory I must be selected from a selection of 48 objects	SKT82, task ‘recognition recall’
Logical reasoning: Matrices Test (‘Matrizentest’)	In a (2×2 or 3×3) matrix of symbols, the bottom right symbol is missing; the composition rule has to be understood and the correct symbol must be selected	Raven’s Standard Progressive Matrices85

SKT, Syndrom-Kurz-Test (engl Short Cognitive Performance Test); WAIS-IV, Wechsler Adult Intelligence Scale-Fourth Edition.