| Stoe IPDS II two-circle diffractometer | 2335 reflections with I > 2σ(I) |
| Radiation source: Genix 3D IµS microfocus X-ray source | Rint = 0.081 |
| ω scan | θmax = 25.7°, θmin = 3.4° |
| Absorption correction: multi-scan (X-Area; Stoe & Cie, 2001) | h = −24→22 |
| Tmin = 0.664, Tmax = 1.000 | k = −11→11 |
| 18262 measured reflections | l = −24→28 |
| 4311 independent reflections |