Table 1.
Parameters | ITO (Ahmmed et al., 2020) | n-ZnSe (Olopade et al., 2012; Samantilleke et al., 1998) | p-Sb2Se3 (Z. Q. Li et al., 2019) | p+-AgInTe2 (Benseddik et al., 2020; El-Korashy et al., 1999; Yang et al., 2017) |
---|---|---|---|---|
Layer type | Substrate | Window | Absorber | BSF |
aThickness [μm] | 0.05 | 0.1 | 1.0 | 0.5 |
Band gap, [eV] | 3.6 | 2.7 | 1.2 | 1.16 |
Electron affinity, χ [eV] | 4.5 | 4.09 | 4.04 | 3.6 |
Dielectric permittivity, ε [relative] | 8.9 | 10 | 18 | 8.9 |
Effective CB density, NC [cm−3] | 2.2×1018 | 1.5×1018 | 2.2×1018 | 3.66×1019 |
Effective VB density, NV [cm−3] | 1.8×1019 | 1.8×1019 | 1.8×1019 | 1.35×1019 |
Electron mobility, [cm2 V−1 s−1] | 50 | 50 | 15 | 1011 |
Hole mobility, [cm2 V−1 s−1] | 10 | 20 | 5.1 | 887 |
aDonor concentration, ND [cm−3] | 1.0×1021 | 1.0×1018 | 0 | 0 |
aAcceptor concentration, NA [cm−3] | 1.0×107 | 0 | 1.0×1015 | 3.5×1019 |
Defect type | Acceptor | Acceptor | Donor | Neutral/Donor |
Energetic distribution | Gaussian | Gaussian | Gaussian | Gaussian |
Reference for defect energy level, Et | Above the highest EV | Above the highest EV | Above the highest EV | Above the highest EV |
Energy with respect to Reference [eV] | 1.8 | 1.35 | 0.6 | 0.58 |
aPeak defect density, N(t) [eV−1 cm−3] | 1.0×1014 | 1.0×1013 | 1.0×1013 | 1.0×1013 |
Characteristic energy [eV] | 0.1 | 0.1 | 0.1 | 0.1 |
Electron capture cross section for defect [cm2] | 10−15 | 10−15 | 10−15 | 10−15 |
Hole capture cross section for defect [cm2] | 10−15 | 10−15 | 10−17 | 10−15 |
is a variable field.