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. 2022 Jul 28;13:4367. doi: 10.1038/s41467-022-32065-x

Fig. 1. Structural characterization and transport properties of perovskite Pr0.82Sr0.18NiO3 and infinite-layer Pr0.82Sr0.18NiO2 thin films.

Fig. 1

a X-ray diffraction θ−2θ symmetric scans of perovskite Pr0.82Sr0.18NiO3 thin film (blue) and infinite-layer Pr0.82Sr0.18NiO2 thin film (red). Reciprocal space mappings (RSM) of b perovskite Pr0.82Sr0.18NiO3 thin film and c infinite-layer Pr0.82Sr0.18NiO2 thin film, respectively. d The atomic-resolution HAADF-STEM imaging of infinite-layer samples in a. e Temperature-dependent resistivity for perovskite Pr0.82Sr0.18NiO3 thin film (blue) and infinite-layer Pr0.82Sr0.18NiO2 thin film (red) which shows a high superconducting transition temperature Tconset ≈ 17 K, as highlighted by the red arrow in the inset of e. Inset of a shows the crystal structure of PrNiO2.