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. 2022 Jul 7;12(15):8746–8760. doi: 10.1021/acscatal.2c01255

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© 2022 The Authors. Published by American Chemical Society

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Analysis of the Ni–N–C-low sample by transmission electron microscopy and electron energy loss spectroscopy mapping. (a) Lower-resolution high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) image. (b) Higher-resolution HAADF-STEM image showing graphitic planes, with individual bright (high Z-number) atoms indicated by green arrows. (c) STEM image of a particle showing a core–shell structure. STEM electron energy loss spectroscopy (EELS) mapping of (d) sulfur and (e) nickel in this particle.