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. 2022 Jul 28;12(15):2593. doi: 10.3390/nano12152593

Figure 8.

Figure 8

Magnetization-temperature curves measured in zero-field-cooling (ZFC) and field-cooling (FC) mode from representative structures consisting of two HfO2-Fe2O3 double layers (a) and one HfO2-Fe2O3-HfO2 triple layer (b). The films were grown on diamagnetic SiO2/Si substrates using cycle sequences represented by labels.