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. 2022 Jul 6;414(22):6531–6540. doi: 10.1007/s00216-022-04210-4

Fig. 4.

Fig. 4

Model assay results of vertical designs, peak shapes (left), and measured current densities after 2-min stop-flow protocol, with inter- and intra-chip variations (right) for a 4-plex vertical, b 6-plex vertical, and c 8-plex vertical. Bar plot of n = 3 replicates. Error bars represent the outlier range and standard deviation written as percentage