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. 2021 Jun 4;3(14):4106–4118. doi: 10.1039/d0na00910e

Fig. 5. Thickness determination by off-axis electron holography performed with the JEOL ARM200F at 200 kV: (a) electron hologram, (b) reconstructed phase and (c) thickness intensity profile after carbon background subtraction ∼68 nm.

Fig. 5