Fig. 2. Microstructural characterization. (a) Cross-sectional STEM HAADF image of the BA1−xMxO (x = 0.8) thin film obtained along the STO[001] zone axis. (b) HR-STEM image of the marked region in (a). The inset shows the selected area electron diffraction (SAED) pattern. (c) HR-STEM image of the marked region in (a) showing the Al-rich region along with two-atomic layer thick and three-atomic layer thick Bi-based slabs. (d)–(h) Cross-sectional STEM image of a BA1−xMxO (x = 0.67) thin film with the corresponding EDS maps.
