A summary of the fitting parameters of the XPS high-resolution peaks.

Element		C–nTES				p–nTES
		B.E. (eV)	FWHM	Peak area	Percent (at%)	B.E. (eV)	FWHM	Peak area	Percent (at%)
N 1s	N C	400.4	1.81	1022.7	20.48%	400.4	1.26	995.3	37.65%
	N–C	399.4	1.38	1775.0	35.54%	399.2	0.93	671.8	25.41%
	N–H	398.3	1.42	2197.1	43.99%	398.5	1.45	976.4	36.94%
S 2p	S–Na	167.6	2.68	320.9	19.33%	168.7	2.16	325.9	20.93%
	S–S	162.9	2.55	848.9	51.14%	164.0	2.22	616.9	39.62%
	S–H	161.5	1.27	490.3	29.53%	162.2	1.17	614.3	39.45%
C 1s	C O	287.5	1.93	2169.3	30.14%	288.4	2.21	1256.4	18.89%
	C–O	286.1	0.91	639.0	8.88%	286.4	1.43	890.2	13.38%
	C C/C–C	284.8	1.61	4389.9	60.99%	284.8	1.45	4504.9	67.73%
O 1s	O–Si	532.5	1.45	1426.4	26.82%	532.7	1.52	3561.5	37.23%
	O–C	531.8	1.20	2237.2	42.07%	531.8	1.05	4101.8	42.87%
	O–H	531.1	1.58	1654.2	31.11%	531.1	1.17	1903.9	19.90%
Si 2p	Si–OH	102.5	1.28	362.0	42.46%	102.3	1.23	407.2	29.06%
	Si–O–Si	101.8	1.19	490.6	57.54%	103.3	1.74	993.9	70.94%