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. 2020 Jul 21;2(9):4172–4178. doi: 10.1039/d0na00405g

Fig. 5. (a) Experimental reflectance (R%) spectra of the BTO–Fe film deposited on a STO/TiN buffer stack and (b) in-plane Inline graphic and out-of-plane Inline graphic components of the real permittivity derived from ellipsometric measurements of the BTO–Fe films grown on various buffers.

Fig. 5