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. 2021 Feb 12;3(6):1717–1724. doi: 10.1039/d0na00928h

Fig. 6. Line scans across a Si–Au step (Si: left, Au: right). The data were measured with the 180 nm detector. The black line in the panel at the bottom represents the AFM-recorded topography, while the colored lines are s-SNOM data obtained at various demodulation frequencies 1Ω–6Ω. The vertical dotted line marks the boundary between the two materials.

Fig. 6