Fig. 2. Experimental setup for in situ TEM resonance observation. (a) A photograph of the JEOL-3100F TEM operated at 300 kV. (b) An arbitrary function generator (AFG3152C) provides a sinusoidal signal v(t) = Vp sin(2πfdt), where Vp is the amplitude of the peak voltage and fd is the driving frequency. A piezo-controlled tungsten (W) probe is located on the right side. On the left side, individual Si NWs are attached to a flattened palladium (Pd) edge. (c) A photograph of the STM-TEM holder with a fixed Pd electrode and a piezo-controlled W probe as marked with red circles. (d) An example of a Si NW oscillating at the 3rd order.
