Fig. 3. SEM micrographs of patchy nonwovens based on s-SEDiPA sCCMs ((A) NW_s-SEDiPA(s)) and wCCMs ((B and C) NW_s-SEDiPA(w)). The SEM image in (C) was acquired on an uncoated sample of NW_s-SEDiPA(w), employing the beam deceleration mode (for details see the Experimental section).