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. Author manuscript; available in PMC: 2023 Apr 26.
Published in final edited form as: Toxicol Sci. 2022 Apr 26;187(1):62–79. doi: 10.1093/toxsci/kfac018

Table 2. Key for interpreting patterns of selective response in Figure 3.

The column label from Figure 3 and corresponding assay endpoint name are provided.

Column
Label in
Figure 3
Assay endpoint name
A MUNDY_HCI_Cortical_NOG_BPCount_loss
B MUNDY_HCI_Cortical_NOG_NeuriteCount_loss
C MUNDY_HCI_Cortical_NOG_NeuriteLength_loss
D MUNDY_HCI_Cortical_Synap&Neur_Matur_BPCount_loss
E MUNDY_HCI_Cortical_Synap&Neur_Matur_CellBodySpotCount_loss
F MUNDY_HCI_Cortical_Synap&Neur_Matur_NeuriteCount_loss
G MUNDY_HCI_Cortical_Synap&Neur_Matur_NeuriteLength_loss
H MUNDY_HCI_Cortical_Synap&Neur_Matur_NeuriteSpotCountPerNeuriteLength_loss
I MUNDY_HCI_Cortical_Synap&Neur_Matur_NeuriteSpotCountPerNeuron_loss
J MUNDY_HCI_Cortical_Synap&Neur_Matur_SynapseCount_loss
K MUNDY_HCI_hN2_NOG_BPCount_loss
L MUNDY_HCI_hN2_NOG_NeuriteCount_loss
M MUNDY_HCI_hN2_NOG_NeuriteLength_loss
N MUNDY_HCI_hNP1_Pro_MeanAvgInten_loss
O MUNDY_HCI_hNP1_Pro_ResponderAvgInten_loss
P CCTE_Shafer_MEA_dev_active_electrodes_number_dn
Q CCTE_Shafer_MEA_dev_burst_duration_mean_dn
R CCTE_Shafer_MEA_dev_burst_rate_dn
S CCTE_Shafer_MEA_dev_bursting_electrodes_number_dn
T CCTE_Shafer_MEA_dev_correlation_coefficient_mean_dn
U CCTE_Shafer_MEA_dev_firing_rate_mean_dn
V CCTE_Shafer_MEA_dev_interburst_interval_mean_dn
W CCTE_Shafer_MEA_dev_mutual_information_norm_dn
X CCTE_Shafer_MEA_dev_network_spike_duration_std_dn
Y CCTE_Shafer_MEA_dev_network_spike_number_dn
Z CCTE_Shafer_MEA_dev_network_spike_peak_dn
A1 CCTE_Shafer_MEA_dev_per_burst_interspike_interval_dn
B1 CCTE_Shafer_MEA_dev_per_burst_spike_percent_dn
C1 CCTE_Shafer_MEA_dev_per_network_spike_interspike_interval_mean_dn
D1 CCTE_Shafer_MEA_dev_per_network_spike_spike_number_mean_dn
E1 CCTE_Shafer_MEA_dev_per_network_spike_spike_percent_dn
F1 CCTE_Shafer_MEA_dev_spike_duration_mean_dn