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. 2022 Aug 24;14(35):39976–39984. doi: 10.1021/acsami.2c09426

Figure 2.

Figure 2

Near-field cathodoluminescence results. (a) atomic force microscopy (AFM) of the unstressed CdSeTe/CdTe device; (b) NF-CL mapping of the unstressed CdSeTe/CdTe device; (c) light intensity profile of NF-CL marked in panel (b); (d) AFM of the stressed CdSeTe/CdTe device; (e) NF-CL mapping of the stressed CdSeTe/CdTe device; and (f) light intensity profile of NF-CL marked in panel (e). The AFM data is shown to help visualize where the NF-CL data is coming from. The luminescence intensity is plotted on a linear scale ranging from 0 to 6. The line profiles start from the glass side toward the back-contact side, as indicated by the arrows.