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. 2022 Aug 8;4(18):3786–3792. doi: 10.1039/d2na00479h

Fig. 1. (a) Setup used to deposit Sn on multilayer hBN at high temperatures. (b) AFM image of a multilayer hBN on SiO2 before the annealing. AFM height (c) and phase (d) images of the hBN after annealing with Sn vapor at 1000 °C for 30 min. (e) AFM height image (upper panel) and the height profile of the corresponding nanoplate and nanotrench (lower panel).

Fig. 1