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. 2001 Feb;183(4):1159–1167. doi: 10.1128/JB.183.4.1159-1167.2001

FIG. 4.

FIG. 4

Electron micrographs of negatively stained, osmotically shocked preparations of strains of serovar Typhimurium carrying mutations in genes that affect the assembly of the needle portion of the needle complex without affecting the integrity of the base substructure. The identity of the different mutant strains is indicated below each panel. The arrows point to base structures (bar, 100 nm).