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. 2022 Aug 19;5(9):12951–12961. doi: 10.1021/acsanm.2c02775

Figure 3.

Figure 3

Top-view SEM micrographs of (A) inverse opal monolayer (scale bar: 400 nm) and (B) inverse opal multilayer (scale bars: 1 μm). Insets: FFT of respective SEM image. Cross-section SEM images of (C) monolayer and (D) multilayer IO architectures.