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. 2022 Sep 22;78(Pt 10):1028–1033. doi: 10.1107/S2056989022009008

Table 2. Experimental details.

  I II
Crystal data
Chemical formula C17H17N3O3 C17H17BrN2O
M r 311.33 345.23
Crystal system, space group Orthorhombic, P n a21 Monoclinic, P21
Temperature (K) 90 90
a, b, c (Å) 18.7779 (4), 10.0699 (2), 15.7288 (3) 7.5162 (3), 6.1125 (2), 15.7249 (5)
α, β, γ (°) 90, 90, 90 90, 98.625 (1), 90
V3) 2974.18 (10) 714.28 (4)
Z 8 2
Radiation type Cu Kα Mo Kα
μ (mm−1) 0.80 2.88
Crystal size (mm) 0.24 × 0.18 × 0.12 0.35 × 0.20 × 0.06
 
Data collection
Diffractometer Bruker D8 Venture dual source Bruker D8 Venture dual source
Absorption correction Multi-scan (SADABS; Krause et al., 2015) Multi-scan (TWINABS; Sheldrick, 2012)
T min, T max 0.854, 0.942 0.568, 0.806
No. of measured, independent and observed [I > 2σ(I)] reflections 24139, 5684, 5575 6918, 6918, 6410
R int 0.027 0.065
(sin θ/λ)max−1) 0.625 0.650
 
Refinement
R[F 2 > 2σ(F 2)], wR(F 2), S 0.028, 0.075, 1.04 0.023, 0.049, 1.04
No. of reflections 5684 6918
No. of parameters 416 191
No. of restraints 1 1
H-atom treatment H-atom parameters constrained H-atom parameters constrained
Δρmax, Δρmin (e Å−3) 0.18, −0.16 0.29, −0.22
Absolute structure Flack x determined using 2442 quotients [(I +)−(I )]/[(I +)+(I )] (Parsons et al., 2013) Flack x determined using 1306 quotients [(I +)−(I )]/[(I +)+(I )] (Parsons et al., 2013)
Absolute structure parameter 0.01 (5) 0.012 (4)

Computer programs: APEX3 (Bruker, 2016), SHELXT (Sheldrick, 2015a ), SHELXL2019/2 (Sheldrick, 2015b ), SHELXTL and XP in SHELXTL (Sheldrick, 2008) and publCIF (Westrip, 2010).