Fig. 6. XAS/EXAFS analysis of Av1*(TOSe).

(a-d) Fe and (e-g) Se K-edge XAS analyses of Av1*(TOS) upon turnover with excess SeO32− for 10 min [designated Av1*(TOSe); black], Av1*(TOSe) upon turnover with excess SO32− for 5 min [designated Av1*(TOSe)5 min, blue], and Av1*(TOSe) upon turnover with excess SO32− for 60 min [designated Av1*(TOSe)60 min, red]. Shown for the Fe K-edge analysis are (a) the pre-edge regions of the normalized fluorescence spectra and (b) smoothed second derivatives of the pre-edge regions, (c) the Fourier transforms of the EXAFS data (dotted) and the best fits of data (solid), and (c) the k3-weighted EXAFS data (dotted) and the best fits of data (solid). Shown for the Se K-edge analysis are (e) the Fourier transforms of the EXAFS data (dotted) and the best fits of data (solid), (f) the k3-weighted EXAFS data (dotted) and the best fits of data (solid), and (g) the spectra of the rising edges compared to the Na2SeO3 standard (dark green). See Supplementary Tables 3–6 and Supplementary Tables 7–9, respectively, for detailed fits of the Fe and Se K-edge EXAFS data.