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. 2022 Oct 10;13:5987. doi: 10.1038/s41467-022-33715-w

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© The Author(s) 2022

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 2 — a XRD patterns of Na-Ru /SiO₂ at different stages. b, c (HR)TEM images and size distribution of Ru NPs for Na-Ru/SiO₂. b Reduced sample; c Spent sample. [Insets: Lattice fringes with distance of 2.04 Å corresponding to the Ru (101) crystal plane shown in (b, c)]. d Ru K-edge FT EXAFS spectra under different conditions on Na-Ru/SiO₂. e Ru K-edge X-ray absorption near-edge structure (XANES) spectra of Na-Ru/SiO₂, Ru/SiO₂, RuO_2, and Ru foil. f C 1 s and Ru 3d photoemission spectra of reduced Ru/SiO₂ and Na-Ru/SiO₂. g DRIFTS spectra of adsorbed CO on Ru/SiO₂ and Na-Ru/SiO₂ at 323 K.