Figure 1.

Correlative microscopy approach: (a) different information is collected in situ from the same individual domain of a polycrystalline Rh foil using different imaging techniques; (b) in PEEM with UV-light excitation, inelastically scattered photoemitted electrons create the image; (c) in XPEEM with X-ray excitation, energy-filtered core level electrons provide the image contrast; and (d) in LEEM, elastically backscattered electrons are utilized. The bright-field imaging mode with a contrast aperture selecting the specularly reflected electron beam was used.