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. 2022 Oct 14;12:17294. doi: 10.1038/s41598-022-22111-5

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© The Author(s) 2022

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/.

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Dynamic DAC experimental setup with fast 2D X-ray diffraction at the extreme conditions beamline P02.2 at PETRA III. (a) Two GaAs LAMBDA photon counting X-ray detectors are positioned on either side of the X-ray beam, where each detector collects a portion of the diffracted Debye–Scherrer rings. (b) Schematic of the piezo-driven dynamic DAC showing how the X-rays pass through the middle of the piezo actuator to interact with the sample that is contained in a gasket between the two diamond anvils (inset zoomed into the sample compartment). (c) Typical pressure–time profile obtained from a ramp compression experiment with the drive voltage is also shown. (d) 2D raw diffraction patterns from four solid phases of Pr obtained on the compression portion of the ramp, where the most intense reflections from the high-pressure Pr phases are indicated with the arrows.