Figure 1.

(a) Schematic of the proposed meta-polarimeter, which gives a diffraction pattern unique to any arbitrary incident polarization state. I(r_n) is the intensity at each diffracted spot n. (b) Schematic of the cross section with light (λ_i = 808 nm) incident from the substrate. (c) SEM image of the fabricated metasurface. (d) Schematic of the measurement setup to obtain a single-shot diffraction pattern on a Andor Marana sCMOS camera. PBS: Polarizing beam splitter. HWP: half-wave plate. QWP: quarter-wave plate. MS: metasurface. CL: condenser lens. FL: Fresnel lens.