Figure 3.

In situ XRD profiles of (A) PdAcCeO₂M and (B) PdCeO₂IW under DRM conditions. The catalyst was pretreated under H₂ at 400 °C for 30 min before switching the gas to a 25%CO₂/25%CH₄/50%He mixture. Temperature was increased to 400 °C under steady-state conditions and further increased (100 °C every 30 min) until reaching 700 °C (red lines mark the first diffraction pattern collected after the temperature increase).