| EBI | Electron Beam Irradiation |
| SEM | Scanning Electron Microscopy |
| AFM | Atomic Force Microscopy |
| BSE | Back-Scattered Electron |
| FFT | Fast Fourier Transform |
| FWHM | Full Width at Half Maximum |
| EBI | Electron Beam Irradiation |
| SEM | Scanning Electron Microscopy |
| AFM | Atomic Force Microscopy |
| BSE | Back-Scattered Electron |
| FFT | Fast Fourier Transform |
| FWHM | Full Width at Half Maximum |