2D	Two Dimensional
ALD	Atomic Layer Deposition
BEOL	Back End of Line
BTI	Bias Temperature Instability
CET	Capacitive Equivalent Thickness
CMOS	Complementary Metal Oxide Semiconductor
EOT	Equivalent Oxide Thickness
FEOL	Front End of Line
FET	Field Effect Transistor
HAADF	High Angle Annular Dark Field
IRDS	International Roadmap for Devices and Systems
MOCVD	Metal Organic Chemical Vapor Deposition
PTCDA	Perylene Tetracarboxylic Dianhydrid
RIE	Reactive Ion Etching
SCTD	Surface Charge Transfer Doping
SWCNT	Single Walled Carbon Nano Tube
TEM	Transmission Electron Microscopy
TLM	Transfer Length Measurement
TMD	Transition Metal Dichalcogenide