Table 1. Summary of the Annealing Temperature and Structural Data Obtained from TEM and XRD Analysesa.
| samples | annealing temperature (°C) | TEM | XRD |
||
|---|---|---|---|---|---|
| l (nm) | a (nm) | microstrain | crystal size (nm) | ||
| CFO | 33(2) | 0.8398(1) | 7.0 × 10–4 | 45(2) | |
| CFO150 | 150(sol.) | 29(2) | 0.8404(1) | 1.3 × 10–5 | 41(2) |
| CFO210 | 210(sol.) | 33(2) | 0.8406(1) | 4.9 × 10–7 | 41(2) |
| CFO270 | 270(sol.) | 29(6) | 0.8404(1) | 4.7 × 10–6 | 40(2) |
| CFO320 | 320(sol.) | 30(2) | 0.8401(1) | 2.3 × 10–4 | 40(2) |
| CFO210-oven | 210(pow.) | 27(2) | 0.8403(1) | 1.0 × 10–3 | 40(2) |
a
TEM particle size was assessed by considering the edge length of cubes or octahedrons (l) and fitting the distribution to a lognormal function. a refers to the cell parameter for the cubic spinel structure. Lattice parameter, microstrain, and crystal size are obtained by Rietveld refinement of the experimental patterns. Uncertainties on the last digit are given in parentheses. Note that the error for microstrain has been assessed to the 10% of the calculated value.