Figure 2.

Elimination of monoclinic Ag₂Te phase in inorganic semiconductor Ag₂Te_1-xS_x (x = 0.3 and 0.4)

(A and B) Stress–strain diagrams for quenched and annealed Ag₂Te_1-xS_x specimens in the compressive test (A) and the tensile test (B). The inset in (B) shows the outer appearance of the tensile samples before and after the tensile test.

(C) Room temperature bulk XRD patterns of the quenched and annealed Ag₂Te_1-xS_x samples. The simulated patterns by VESTA are displayed for comparison.

(D) DSC heating curves for quenched and annealed Ag₂Te_1-xS_x samples with a heating rate of 5 K/min. The curve of the quenched x = 0.4 sample has been shifted down along the y axis to avoid overlapping with other measured curves