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. 2021 May 20;46(2):160–167. doi: 10.1584/jpestics.D20-064

Fig. 2. Effect of calibration on the peak height from the sequencer. Left panel: the logit proportion of the unadjusted peak height of the resistance DNA, loge(HR)−loge(HS). Right panel: the logit proportion of the adjusted peak height of the resistance DNA, loge(HA,R)−loge(HA,S). The horizontal axis indicates the logit proportion of the resistance DNA, loge(xR)−loge(xS). The dotted lines and solid lines indicate the regression curves for the first- and second-order polynomial regression for showing the effectiveness of calibration, respectively. To improve visibility, all of the points are jittered horizontally.

Fig. 2. Effect of calibration on the peak height from the sequencer. Left panel: the logit proportion of the unadjusted peak height of the resistance DNA, loge(HR)−loge(HS). Right panel: the logit proportion of the adjusted peak height of the resistance DNA, loge(HA,R)−loge(HA,S). The horizontal axis indicates the logit proportion of the resistance DNA, loge(xR)−loge(xS). The dotted lines and solid lines indicate the regression curves for the first- and second-order polynomial regression for showing the effectiveness of calibration, respectively. To improve visibility, all of the points are jittered horizontally.