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. 2022 Nov 11;12:19319. doi: 10.1038/s41598-022-23839-w

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© The Author(s) 2022

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/.

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Characterization of CVD-Ce³⁺:LuAG thick film scintillators. (a) Cross-sectional SEM image of 14 μm-thick Ce³⁺:LuAG thick film scintillator grown on (100) YAG substrate (CVD-14). (b) Absorption spectra of the CVD-Ce³⁺:LuAG thick film scintillators with various thicknesses (CVD-1 to CVD-30) and reference Ce³⁺:LuAG single crystal (SC-1000). (c) Photoluminescence–excitation contour plot of CVD-20 and SC-1000. (d) Photographs of the Ce³⁺:LuAG thick film scintillators with various thicknesses (CVD-1 to CVD-30) and SC-1000 under room light.