| Thermal evaporation |
Red Cu2O powder |
Base pressure: 5 × 10−4 Pa |
Glass tantalum SiO2
|
— |
High |
43
|
| Temperature: 300 °C |
| Annealing temperature: 500 °C |
| Electron beam evaporation |
Cu2O pellets |
Deposition time: 5–16 min |
Glass |
Moderate |
High |
44
|
| Substrate temperature: 200 °C |
| Accelerating voltage: 2, 4 and 6 kV |
| Evaporation pressure: 3 × 10−2 Pa |
| Ultimate pressure: 4 × 10−4 Pa |
| Filament current: 30 mA |
| Pulsed laser deposition |
Cu, O2
|
Substrate temperature: 25–400 °C |
Quartz ITO NaCl |
Excellent |
High |
45
|
|
p
O2: 0–10 mTorr |
| Vacuum chamber pressure: Torr |
| Molecular beam epitaxy |
Cu, O2
|
Incident O+ beam energy: 50 eV |
MgO |
Excellent |
High |
46
|
| Substrate temperature: 100–400 °C |
| Cu flux: 2.5 × 1013 to 1.6 × 1014 atoms per cm2 s |
| Base pressure: 3 × 10−10 torr |
| Total pressure: 3 × 10−9 to 2 × 10−8
|
| O+ flux: 2.7 × 1014 atoms per cm2 s |
| Ion plating evaporation |
Cu, O2
|
Base pressure: 10−4 Pa |
Glass |
Excellent |
High |
47
|
| O2 flow rate: 15–45 sccm |
| N2 flow rate: 0–6 sccm |
| RF power: 300 W |
| Annealing temperature: 300 °C |
| Substrate temperature: 25 °C |
| Direct current (DC) sputtering |
Cu, O2
|
Deposition pressure: 6.3 × 10−3 torr |
Glass |
Excellent |
High |
48 and 49
|
| Base pressure: 6 × 10−6 torr |
| Sputtering power: 60 W |
| Ar gas pressure: 20 sccm |
|
p
O2: 8.0 × 10−4 to 1.8 × 10−3 torr |
| Cu, O2
|
Sputtering power: 10–40 W |
Glass stainless steel |
| Ar flow rate: 15 sccm |
| O2 flow rate: 10 sccm |
| Substrate temperature: 300 °C |
| Ambient gas pressure: 0.045 Pa |
| Radio frequency (RF) sputtering |
Cu, O2
|
Substrate temperature: 300 °C |
Glass |
Excellent |
High |
50
|
| Ar flow rate: 10 sccm |
| O2 flow rate: 0–2 sccm |
| Deposition time: 60 min |
| Background pressure: <3 × 10−4 Pa |
| Working pressure: 1.7–1.8 Pa |