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. 2022 Oct 30;9:101898. doi: 10.1016/j.mex.2022.101898

Table 5.

Process to fabricate photoresist pillars using AZ5214-E photoresist and to lift-off AZ5214-E photoresist after dielectric deposition.

Step Equipment Details Comments
Photolithography recipe to define AZ5214-E photoresist pillars with undercut

Spin-coat
AZ5214-E
Spin-coater 2500 RPM, 30 s, 2500 RPM/s Approximately 1 µm thick photoresist film

Soft bake Hot plate 95°C, 60 s Hotplate surface temperature

Photolithography Contact aligner / stepper, photomask 14.4 mJ/cm2, 365 nm (i-line) UV Use index matching fluid to improve contact between SU-8 and mask and create hard-contact in the case of contact aligner

Wait time Wet bench / hood 5 mins N2 bubble release

Post-exposure bake Hot plate 105°C, 60 s Hotplate surface temperature.

Flood-expose Contact aligner / stepper, no photomask 860 mJ/cm2, 365 nm (i-line) UV Image reversal

Develop in AZ300 MIF developer Wet bench 30 s Wash developer off in D.I. water and blow dry water in N2

AZ5214-E photoresist lift-off recipe

Soak in Remover PG stripper Wet bench 20 mins on a hotplate set at 95°C Occasional stirring

Ultrasonication in Remover PG stripper Wet bench 20 mins Heated / unheated water bath for ultrasonication