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. 2022 Oct 15;298(12):102596. doi: 10.1016/j.jbc.2022.102596

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© 2022 The Authors

This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).

PMC Copyright notice

Synthesis and characterization of chitosan nanoparticles (NPs). Chitosan NPs were synthesized by the ionic-gelation method and used for characterization. A, DLS data depict the average hydrodynamic size and particle size distribution of the NPs. B, ζ-potential data of the NPs show the average surface charge of the NPs. C, FE-SEM and (D) TEM micrographs of the synthesized NPs represent the surface morphology and size, respectively. E, AFM micrograph, analyzed histogram, and 3D plot data depict the distribution and size analysis of well-dispersed NPs. The arrows in colors in the histogram are corresponding to the colored arrows in the magnified image of the AFM micrograph. The colored rectangles show the point of contact in the respective histograms for size measurement for each NP. AFM, atomic force microscopy; DLS, dynamic light scattering; FE-SEM, field emission scanning electron microscopy; TEM, transmission electron microscopy; ζ-potential, zeta potential.

Inline graphic — Synthesis and characterization of chitosan nanoparticles (NPs). Chitosan NPs were synthesized by the ionic-gelation method and used for characterization. A, DLS data depict the average hydrodynamic size and particle size distribution of the NPs. B, ζ-potential data of the NPs show the average surface charge of the NPs. C, FE-SEM and (D) TEM micrographs of the synthesized NPs represent the surface morphology and size, respectively. E, AFM micrograph, analyzed histogram, and 3D plot data depict the distribution and size analysis of well-dispersed NPs. The arrows in colors in the histogram are corresponding to the colored arrows in the magnified image of the AFM micrograph. The colored rectangles show the point of contact in the respective histograms for size measurement for each NP. AFM, atomic force microscopy; DLS, dynamic light scattering; FE-SEM, field emission scanning electron microscopy; TEM, transmission electron microscopy; ζ-potential, zeta potential.