Figure 6.

X-ray photoelectron spectroscopy (XPS) of CoCrFeNiMo${}_{0.2}$ 100-nm-thick film transferred on a cover glass by magnetron sputtering. Such a film was used as as a carrier for LIFT. Magnetron sputtering was carried out at the order of ${10}^{-3}$ Torr. The CasaXPS software package was used for XPS data analysis. A wide-range binding energy spectrum and detailed elemental bands (normalised) are shown; background highlights (green) show the energy window used for quantification. Bold markers in the legends are for the oxide states: CoO, FeO, Cr(III) [chromia Cr${}_2$O${}_3$], Mo(VI) [MoO${}_3$], and Mo(V) [Mo${}_2$O${}_5$].