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. 2022 Nov 11;15(22):7990. doi: 10.3390/ma15227990

Figure 9.

Figure 9

(a) Atomic percentages of Si in the total quantification of elements determined by XPS, giving indications of the SEI layer thickness on top of silicon surface; (b) atomic percentages of lithium fluoride in the total quantification of elements determined by the peak surface area corresponding to LiF. LiF is the main inorganic component in the SEI.