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. 2022 Dec 2;13:7454. doi: 10.1038/s41467-022-34203-x

Fig. 6. Improved electron extraction and hole blocking at perovskite/C60 interface.

Fig. 6

3D conductive-AFM images (5 × 5 μm) of the samples with a structure of ITO/MeO-2PACz/Pero/CB-NH2/ C60 (CB-NH2 treated) and ITO/MeO-2PACz/Pero/ C60 (control). The images represent a step-by-step applied voltage variation from −1.0 V applied to the tip (left) for hole extraction to 1.0 V applied to the tip (right) for electron extraction.