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. 2022 Dec 7;12(54):34850–34873. doi: 10.1039/d2ra06734j

Input parameters of interface defect layers14.

Interface Defect type Capture cross section: electrons/holes (cm2) Energetic distribution Reference for defect energy level Total density (cm−3) (integrated over all energies)
ETL/Cs2BiAgI6 Neutral 1.0 × 10−17 Single Above the VB maximum 1.0 × 1010
1.0 × 10−18
Cs2BiAgI6/HTL Neutral 1.0 × 10−18 Single Above the VB maximum 1.0 × 1010
1.0 × 10−19