Input parameters of interface defect layers14.
| Interface | Defect type | Capture cross section: electrons/holes (cm2) | Energetic distribution | Reference for defect energy level | Total density (cm−3) (integrated over all energies) |
|---|---|---|---|---|---|
| ETL/Cs2BiAgI6 | Neutral | 1.0 × 10−17 | Single | Above the VB maximum | 1.0 × 1010 |
| 1.0 × 10−18 | |||||
| Cs2BiAgI6/HTL | Neutral | 1.0 × 10−18 | Single | Above the VB maximum | 1.0 × 1010 |
| 1.0 × 10−19 |