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. 2022 Dec 2;15(23):8600. doi: 10.3390/ma15238600

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© 2022 by the authors.

Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).

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X-ray diffraction pattern of raw materials. Part (A): porcelain stoneware (PS), gypsum (Gy), and metakaolin; Part (B): Raw pressed (RP) and annealed raw pressed (RP_dry) waste. The numbers correspond to main diffraction peaks (with relative ICDD PDF-4+ 2021 card numbers) of 1-Quartz (SiO₂) (01-083-0539); 2-Sillimanite (Al₂SiO₅) (01-088-0893); 3-Gypsum (CaSO₄·2(H₂O)) (00-003-0053); 4-Albite (NaAlSi₃O₈) (01-089-6427); 5-Kaolinite (Al₂Si₂O₅(OH)₄) (01-080-0886); and 6-Anatase (TiO₂) (01-070-7348).