Table 2.

Berezinskii–Kosterlitz–Thouless (BKT) parameters derived by the analysis of the resistivity and I-V characteristics curves of some of the thinner NbN films. Column headings, from left: sample acronym *; BKT temperature derived by $\rho \left(T\right)$ fitting with Equation (2); SC transition temperature at B = 0 (see the text); normal state sheet resistance at 20 K; $\gamma$ value (see the text and Equation (1)); VAP polarizability.

Sample	${\mathit{T}}_{\mathit{BKT}}$ (K)	${\mathit{T}}_{\mathit{c}0}$ (K) **	${\mathit{R}}_{\square \mathit{N}}$ ($\mathsf{\Omega }$)	$\mathsf{\gamma }$	$\mathsf{ϵ}$
MO5a	9.70 ± 0.03	9.90	502.30 ± 0.01	0.970 ± 0.002	10.28 ± 0.030
MO5b	10.30 ± 0.02	10.60	620 ± 1.06	1.500 ± 0.005	11.49 ± 0.022
MO10	13.060 ± 0.008	13.31	129.8 ± 0.60	1.56 ± 0.09	25.5 ± 0.11

* For meaning of sample acronym see the caption of Table 1. ** The fitting error on ${\mathit{T}}_{\mathit{c}0}$ is of the order of 10⁻⁴.