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. 2020 Nov 13;109(4):1086–1095. doi: 10.1016/j.ijrobp.2020.10.035

Table 2.

Classification system for plans using M3D and IC results

Classification Description Indications
TP Failing plans were correctly identified as failing (failed both M3D and IC) IC measurement required
FP Passing plans were incorrectly identified as failing (failed M3D but passed IC) IC measurement required
TN Passing plans were correctly identified as passing (passed both M3D and IC) No IC measurement required
FN Failing plans were incorrectly identified as passing (passed M3D but failed IC) No IC measurement required

Abbreviations: FN = false negative; FP = false positive; IC = ion chamber; M3D = Mobius3D; TN = true negative; TP = true positive.