Table 5.
Confusion matrices when a 3% M3D threshold is used to predict 4% IC threshold
| Training | Testing | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| All machines | All machines | ||||||||
| n = 1113 | Ion chamber | Plans to QA | n = 350 | Ion chamber | Plans to QA | ||||
| Fail | Pass | Fail | Pass | ||||||
| M3D | Fail | 21 | 259 | 25.2% | M3D | Fail | 1 | 103 | 29.7% |
| Pass | 0 | 833 | Pass | 0 | 246 | ||||
| Versa | Versa | ||||||||
| n = 208 | Ion chamber | n = 41 | Ion chamber | ||||||
| Fail | Pass | Fail | Pass | ||||||
| M3D | Fail | 18 | 96 | 54.8% | M3D | Fail | 0 | 28 | 68.3% |
| Pass | 0 | 94 | Pass | 0 | 13 | ||||
| Truebeam STx | Truebeam STx | ||||||||
| n = 362 | Ion chamber | n = 98 | Ion chamber | ||||||
| Fail | Pass | Fail | Pass | ||||||
| M3D | Fail | 2 | 61 | 17.4% | M3D | Fail | 0 | 21 | 21.4% |
| Pass | 0 | 299 | Pass | 0 | 77 | ||||
| Truebeam | Truebeam | ||||||||
| n = 543 | Ion chamber | n = 212 | Ion chamber | ||||||
| Fail | Pass | Fail | Pass | ||||||
| M3D | Fail | 1 | 102 | 19.0% | M3D | Fail | 1 | 57 | 27.4% |
| Pass | 0 | 440 | Pass | 0 | 154 | ||||
Abbreviations: IC = ion chamber; M3D = Mobius3D; QA = quality assurance.