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. 2022 Dec 21;55(2):135. doi: 10.1007/s11082-022-04384-2

Design and analysis of graphene- and germanium-based plasmonic probe with photonic spin Hall effect in THz frequency region for magnetic field and refractive index sensing

V A Popescu 1, Kinjal Chauhan 2, Yogendra Kumar Prajapati 3, Anuj K Sharma 2,
PMCID: PMC9770562  PMID: 36573203

Abstract

In this work, we analyze the design of a graphene- and germanium-based plasmonic sensor with photonic spin Hall effect (PSHE) for detection of refractive index (RI) of a gas medium and magnetic field (B) applied to the graphene monolayer in THz frequency region. The PSHE phenomenon is studied in both conventional as well as modified weak measurements. The effect of gaseous medium thickness (d4), transverse magnetic (TM) mode’s order, and amplified angle parameter (Δ) is studied on the sensor’s performance. Parameters such as sensitivity, resolution, and figure of merit have been considered for sensor’s performance evaluation. The results indicate that in the conventional weak measurements, for a TM1 mode (with d4 = 20 µm, B = 0, and Δ = 0.1°), an RI resolution of 2.32 × 10−12 RIU is achievable for gas medium in the range 1–1.1 RIU. In the modified weak measurements, for a TM3 mode (with d4 = 100 µm, B = 0, and Δ = 0.1°), the RI resolution close to 1.39 × 10−10 RIU is achievable for gas sensing. The same sensor design was also studied for magnetic field sensing while keeping the value of gaseous medium RI (n4) as 1. The results indicate that for a TM1 mode (with d4 = 20 µm and Δ = 0.1°), in the conventional weak measurements, a magnetic field resolution of 5.31 × 10−4 µT (i.e., 0.53 nT) is achievable for a range 0–1 T of B. Further, it is found that in contrast with the conventional case, the resolutions in the modified weak measurements are improved for large values of the Δ. Some of the results emerge better or comparable with the resolutions of RI and magnetic field measurement (5 × 10−9 RIU and 0.7 µT or 1.22 × 10−11 RIU and 1.46 × 10−2 µT) existing in the literature.

Keywords: Graphene, Germanium, Magnetic field, Sensor, Plasmon, Terahertz, Photonic spin Hall effect

Introduction

The refractive index (RI) and magnetic field resolutions hold great importance (minimum detectable) in evaluating the sensing performance of a surface plasmon resonance (SPR) sensor. An RI resolution of 5 × 10−9 RIU was obtained by using a fiber-optic Fabry–Perot interferometer (FPI) sensor for monitoring of small changes in the composition of gases as described in Pevec and Donlagic (2018).

A sensor whose sensing element is a ferrofluid filled high-birefringence-photonic crystal fiber (PCF) inserted into a Sagnac loop was used to get magnetic field sensitivity of 1.073 nm/mT with a resolution of 1 µT for a magnetic field ranging from 10 to 40 mT (Zhao et al. 2016).

Recently, the transverse spin-dependent shift (SDS) of the horizontal photonic spin Hall effect (PSHE) at a given frequency (5 THz) has been considered to analyze a graphene-based plasmonic sensor with four layers (germanium, dielectric, graphene, and gaseous medium) for detection of RI of a gas medium and magnetic field applied to the graphene layer (Popescu et al. 2022). PSHE refers to reflection and splitting of linearly polarized incident light into left circularly polarized (LCP) and right circularly polarized (RCP) light due to RI gradient prevailing in the given optical structure. The strong plasmonic properties of graphene monolayer are of great significance which can be exploited for the sensing purpose in THz frequency region. In the conventional weak measurements, an RI resolution of 1.22 × 10−11 RIU was achievable for gas medium (when gas RI is changed from 1 to 1.1 RIU) (for a magnetic field B = 0 T and an amplified angle Δ = 0.1°). Further, in the conventional weak measurements, a magnetic field resolution of 1.46 × 10−2 µT (gaseous medium RI taken as 1) was reported corresponding to magnetic field range of 0–0.1 T (for an amplified angle Δ = 0.1°). Also, in the modified weak measurements, a RI (magnetic field) resolution of 6.24 × 10−17 RIU (3.59 × 10−6 µT) was reported to be achievable (for an amplified angle Δ = 5.730°). These types of sensors could be extremely useful in early detection of airborne viruses such as SARS-Cov-2 and also in the early detection of radiation leakage in nuclear reactors (Kumar et al. 2022).

In another recent paper (Popescu et al. 2021), a plasmonic sensor with three (silicon, gold and magnetic fluid) layer waveguide structure was analyzed by using the transverse SDS of the horizontal PSHE in the waveguide at a given wavelength (1557 nm) for a TM mode. A magnetic field resolution of the order of 1.50 × 10−6 Oe was reported in the conventional weak measurements for an amplified angle Δ = 0.1° and 7.80 × 10−8 Oe in the modified weak measurements for Δ = 28.65°.

However, it is expected that by using additional layers of the concerned materials and/or manipulating their locations in the sensor design might bring reasonable improvement in the sensor’s performance. In this paper, we calculate the amplitude reflection coefficients by using the transfer matrix and guided-wave surface plasmon resonance methods. Then we analyze the influence of a supplementary germanium layer of a graphene-based plasmonic sensor with five layers (germanium, dielectric, graphene, gaseous medium, and germanium) for detection of the RI of a gas medium and magnetic field applied to the graphene monolayer at 5 THz frequency. The performance is closely analyzed in terms of the concerned performance parameters.

Plasmonic sensor with photonic spin Hall effect

Figure 1 shows the schematic diagram of the plasmonic sensor with PSHE with five layers-Ge prism, organic layer, graphene, gas medium and outside medium consisting of Ge.

Fig. 1.

Fig. 1

Schematic of an optical structure with five layers (germanium, organic layer, graphene, gas medium and germanium) as a plasmonic sensor based on PSHE, where δH and δ+H are the transverse displacements of LCP and RCP components of light, respectively. The gaseous medium flows in the gas sensing layer from the left part

The RI values of the layers, for a fixed frequency of 5 THz, are listed in Table 1:

Table 1.

Optical parameters of the concerned layers in the sensor design (Popescu et al. 2022)

Layer Material RI Thickness
1 Germanium n1 = 4
2 Organic layer n2 = 1.5 51 nm
3 Graphene n3 = 5.189555 + 108.627427i at B = 0 T 0.34 nm
n3 = 5.307784 + 109.1106197i at B = 1 T
4 Gas medium n4 (varied from 1 RIU to 1.1 RIU) d4 (varied: 1–200 µm)
5 Germanium n5 = 4

The RI gradient plays the role of electric potential gradient. The real part of graphene RI is greater than the RI of Ge, and it ensures that the light is confined near the graphene layer in this plasmonic structure (Popescu et al. 2022). It should be specifically noted that the RI of graphene monolayer (n3) is dependent on B incident perpendicular to the graphene surface (Popescu et al. 2022) as per following expression:

n3=εg=1+iσgωtgε0=1+iσ0ωtgε0×i(ω+iτ)ω+iτ2-ωc2=1+iσ0τωtgε0×(1-iωτ)(ωcτ)2+(1-iωτ)2, 1

In Eq. (1), εg is the relative permittivity (dielectric constant) of graphene monolayer, σg is the conductivity of graphene, ω=2πν is the angular frequency, ν is the frequency, tg = 0.34 nm is the effective thickness of graphene monolayer, ε0 = 8.854 × 10−12 F/m is the permittivity of vacuum, σ0=e2EF/(πħ2), σ00 = σ0τ is a static conductivity without magnetic field, EF = 0.3 eV is the Fermi energy, τ=μEF/(evF2) is the carrier relaxation time, μ = 1 m2/Vs is the carrier mobility, vF = 9.5 × 10−5 m/s is the Fermi velocity and ωc=eBvF2/EF is the cyclotron frequency of electrons in graphene. At a frequency of ν = 5 THz the energy of the incident radiation of hν = 0.021 eV is smaller than a Fermi energy EF = 0.3 eV. Also, the Fermi energy (0.3 eV) is larger than the thermic energy (kBT = 0.025 eV) at the room temperature T = 293.15 K where kB is the Boltzmann constant. In this case the interband conductivity (1.28 × 10−7–1.34 × 10−6i) is negligible, and the intraband conductivity (1.07 × 10−4 + 1.11 × 10−3i) is simplified.

The transverse SDS of two TM spin Hall effect components are defined as follows as per Popescu et al. (2022), Zhou et al. (2018):

δ±H=λ2π1+rsrpcotθ 2

where rp and rs are the Fresnel reflection coefficients for parallel and perpendicular polarizations, respectively, and θ is the incident angle. In this work, only the component δ-H of the horizontal polarization is considered. The corresponding amplified SDS in the conventional weak measurements is (Popescu et al. 2022; Zhou et al. 2018):

Aδ-H=δ-HzrzLcotΔ, 3

where zr (250 mm) is the z coordinate in the reflected light, zL=12kw2 is the Rayleigh length, k is the wave-vector, w is the beam waist (10 µm in the focused incident light), and Δ is the post-selected (amplified) angle (Popescu et al. 2022; Zhou et al. 2018). In the modified weak measurements (Popescu et al. 2022; Zhou et al. 2012), the amplified shift is:

Amδ-H=zr(2krpzL(rp+rs)+(rp/θ)2)sin(2Δ)cotθ2kzL(rp+rs)2cos2Δcot2θ+4(krpzLsinΔ)2 4

If 2krpzL(rp+rs)>>(rp/θ)2 and 2kzL(rp+rs)2cos2Δcot2θ<<4(krpzLsinΔ)2, the amplified modified shift Amδ-H can be replaced with amplified conventional shift Aδ-H.

Amplitude reflection coefficients (transfer matrix method)

In the transfer matrix method (Sharma et al. 2019; Popescu 2019a), the amplitude reflection coefficients (rs for TE modes and rp for TM modes) for a device with N = 5 layers are given by

rs=(M11s+M12sq5s)q1s-(M21s+M22sq5s)(M11s+M12sq5s)q1s+(M21s+M22sq5s)rp=(M11p+M12pq5p)q1p-(M21p+M22pq5p)(M11p+M12pq5p)q1p+(M21p+M22pq5p), 5

where

Ms=M2sM3sM4s=M11sM12sM21sM22s,Mp=M2pM3pM4p=M11pM12pM21pM22p, 6
Mjs=cos(βj)-isin(βj)qjs-iqjssin(βj)cos(βj),Mjp=cos(βj)-isin(βj)qjp-iqjpsin(βj)cos(βj), 7

where j = 2,3,4

q1s=n12-n12sin2(θ1),q1p=q1sn12, 8
qjs=nj2-n12sin2(θ1),qjp=qjsnj2,βj=2πdjλnj2-n12sin2(θ1) 9

where j = 2,3,4.

q5s=n52-n12sin2(θ1),q5p=q5sn52 10

The corresponding intensity reflection coefficients are:

Rs=rs2,Rp=rp2 11

The corresponding output powers are:

Ps=RsLDtan(θ1),Pp=RpLDtan(θ1), 12

where L is the sensing length, D is the width of the core layers with incident angle θ1 in optical structure (L/D = 25). The corresponding power losses (in dB) are:

PLs=10Log1Ps,PLp=10Log1Pp 13

Amplitude reflection coefficients (guided-wave surface plasmon resonance configuration)

Another similar variant to calculate the amplitude reflection (Fresnel) coefficients (rp and rs) is to use the guided-wave surface plasmon resonance (GWSPR) configuration (Xiang et al. 2017; Wang et al. 2019):

rs=r12s+r2345sexp(iϕ2)1+r12sr2345sexp(iϕ2),rp=r12p+r2345pexp(iϕ2)1+r12pr2345pexp(iϕ2), 14

where

rj(j+1)s=njcosθj-n(j+1)2-nj2sin2θjnjcosθj+n(j+1)2-nj2sin2θj,rj(j+1)p=n(j+1)2cosθj-njn(j+1)2-nj2sin2θjn(j+1)2cosθj+njn(j+1)2-nj2sin2θj 15

where j = 1,2,3,4

r345s=r34s+r45sexp(iϕ4)1+r34sr45sexp(iϕ4),r345p=r34p+r45pexp(iϕ4)1+r34pr45pexp(iϕ4), 16
r2345s=r23s+r345sexp(iϕ3)1+r23sr345sexp(iϕ3),r2345p=r23p+r345pexp(iϕ3)1+r23pr345pexp(iϕ3), 17

The corresponding phase term can be given as:

ϕj=4πλnjdjcosθj 18
θj=arcsinn(j-1)sinθ(j-1)nj 19

where j = 2,3,4.

Sensor’s performance parameters

In the angular interrogation method (Popescu 2019b; Popescu and Sharma 2019, 2020; Sharma et al. 2020), the wavelength is kept constant and the angle of incidence is varied and a sharp dip (maximum of the power loss) appears at a resonance incidence angle θ1 in the reflectivity. The resonance incidence angle is dependent on the RI of the sensing medium. The sensing performance of the sensor is primarily determined by the angular sensitivity (Sθ) calculated for an increase of na with δna:

Sθ=δθresδna, 20

the maximum of the power sensitivity (SPL) calculated for an increase of na with δna,

SPL=δPLδna, 21

the figure of merit (FOM):

FOM=δθresδnaδθ0.5, 22

where δθres is the shift in the resonance angle corresponding to the variation δna in the analyte RI, δθ0.5 is the angular width of resonance spectrum, PLa is the power loss at na + δna, and PL is power loss corresponding to reference analyte na.

The sensitivity (Sn in µm/RIU) of gaseous RI measurement is defined as the ratio of the difference in the optimal amplified shift to the change in sensing (gas) medium RI (Srivastava et al. 2021; Zhou et al. 2018; Prajapati 2021):

Sn=Δ(Aδ-H)δn4=Aδ-H-Aδ-Hδn4 23

where AδH and A′δH are amplified SDS for a given value of the magnetic field and analyte RI values of n4 = 1 and or n4a = 1.1, (i.e., δn4 = 0.1 RIU) respectively. The corresponding RI resolution (in RIU) is defined as:

Rn=δdSn, 24

where it is assumed that the resolution of spatial measurement δd is 0.2 µm. This value of δd corresponds to the resolution of a commercial laser sensor (Laser thickness gauge 2021).

The magnetic field sensitivity (SB in µm/T) is defined for a given value of n4 = 1 as the ratio of difference in the optimal amplified shift to the change in the magnetic field (which basically leads to a variation in graphene layer RI) as:

SB=Δ(Aδ-H)δB=Aδ-H-Aδ-HδB 25

The magnetic field values are varied between B = 0 T and B = 1 T. The corresponding magnetic field resolution (in T) is defined as

RB=δdSB, 26

Here, it is assumed (and as mentioned earlier) that the resolution of spatial measurement (δd) is 0.2 µm.

Results and discussion

Occurrence of SPR in the proposed sensor design

Keeping in view that the RI sensitivity is affected by the thickness of the sensing layer (d4), we have tried to investigate how the variation of d4 affects the sensor’s performance. In this context, Fig. 2 shows the variation of |rp| and PL with incident angle θ in optical structure corresponding to a TM1 single mode for d4 = 20 µm, n4 = 1 (a), n4a = 1.1 (b), and B = 0 T.

Fig. 2.

Fig. 2

Variation of absolute value of a Fresnel reflection coefficient |rp|, and b power loss PL with incident angle θ in optical structure corresponding to a TM1 mode for d4 = 20 µm, n4 = 1, n4a = 1.1 and B = 0 T

The above figure shows that the resonance takes place at θ = 14.1288° and PL = 3142.906 dB for n4 = 1. Further, for n4a = 1.1, the resonance occurs at θ = 15.4724° and PL = 2733.183 dB. Therefore, for B = 0 T, the angular sensitivity, Sθ, under the angular interrogation method turns out to be 13.4353° RIU−1 and the corresponding resolution, i.e., Rθ is 7.44 × 10−6 RIU while assuming that the standard resolution (δθa) available for angular measurement is 0.0001° (Sharma and Nagao 2014). The corresponding power loss sensitivity, SPL, is 4097.233 dB/RIU and the corresponding resolution, RPL, is 2.44 × 10−6 RIU while assuming that the standard power loss resolution (δPLa) available is 0.01 dB (Gao and Jiang 2013). Further, the angular width of the resonance spectrum is δθ0.5 = 0.6107°, and the corresponding FOM is 21.999 RIU−1.

Influence of variation in TM mode and d4 on sensing performance

Getting ahead with the analysis, Fig. 3 shows the variation of PL with incident angle θ in optical structure corresponding to TM1, TM2 and TM3 modes for d4 = 100 µm, n4 = 1 and B = 0 T.

Fig. 3.

Fig. 3

Variation of power loss PL with incident angle θ in optical structure corresponding to, TM1, TM2 and TM3 modes for d4 = 100 µm, n4 = 1 and B = 0 T

Above figure shows that for n4 = 1 and B = 0 T, the resonance (i.e., power loss peak) for TM1, TM2 and TM3 modes takes place at θ = 13.9128° (PL = 3205.902 dB), 11.6012° (PL = 6126.030 dB), and 6.3768° (PL = 11,410.844 dB), respectively. Further, for n4a = 1.1, the resonance corresponding to TM3 mode occurs at θ = 9.1974° and PL = 7863.956 dB. Therefore, for B = 0 T, the angular sensitivity (Sθ) under angular interrogation method turns out to be 28.2057° RIU−1 and the corresponding resolution (Rθ) is 3.54 × 10−6 RIU. The above values suggest that the power loss sensitivity (SPL) and resolution (RPL) corresponding to TM3 mode are 35,468.881 dB/RIU and 2.82 × 10−7 RIU, respectively. Further, δθ0.5 = 0.1793° for PL curve corresponding to TM3 mode, and the corresponding FOM comes out to be 157.279 RIU−1.

So, the comparison between results presented in Figs. 2 and 3 reveal that if we increase d4 from 20 µm for a TM1 mode to 100 µm for a TM3 mode, the angular width of resonance spectrum decreases considerably from 0.6107° to 0.1793° leading to nearly 7.5 times increase in FOM from 21.999 to 157.279 RIU−1. The above is a significant result in terms of sensing performance enhancement. Taking cue from this result, if one considers even higher order mode (e.g., TM6) with greater d4, the FOM is expected to get further improved.

In order to have a broader outlook of the above discussion, Table 2 summarizes the values of PL (dB), Sθ (°/RIU), Rθ (RIU), SP (dB/RIU), RP (RIU), δθ0.5 (°) and FOM (RIU−1) for a TM1 mode when d4 is 1.2 µm, 10 µm, 20 µm, 30 µm. The same table also contains the corresponding values for a TM3 mode when d4 = 100 µm, and for a TM6 mode when d4 = 200 µm.

Table 2.

Values of relevant sensor parameters for a TM1 mode for 4 different values of d4 (1.2–30 µm). For comparison purpose, all these sensor parameters are also listed for a TM3 mode when d4 = 100 µm and for a TM6 mode when d4 = 200 µm for B = 0 T

Mode d4 PL Sθ Rθ SP RP δθ0.5 FOM
TM1 1.2 5861.7 14.63 6.83 × 10−6 1.02 × 104 9.84 × 10−7 1.27 11.49
TM1 10 3734.6 13.55 7.38 × 10−6 4.86 × 103 2.06 × 10−6 0.81 16.64
TM1 20 3142.9 13.44 7.44 × 10−6 4.10 × 103 2.44 × 10−6 0.61 22.00
TM1 30 2829.6 13.37 7.48 × 10−6 3.57 × 103 2.80 × 10−6 0.53 25.33
TM3 100 11410.8 28.21 3.55 × 10−6 3.55 × 104 2.82 × 10−7 0.18 157.28
TM6 200 11502.5 28.28 3.54 × 10−6 3.60 × 104 2.78 × 10−7 0.09 314.38

The values contained in Table 2 clearly indicate that for TM1 mode, the FOM improves as the value of d4 increases. This is due to a significant decrease in δθ0.5, which leads the overall FOM to increase even though the sensitivity decreases with an increase in d4. Further, for even greater magnitude of d4 (100 nm, 200 nm) and for higher order modes (TM3, TM6), there is a highly significant increase in the sensor’s FOM. More precisely, the FOM reaches as high as 314.38 RIU−1 for TM6 mode with d4 = 200 nm.

Analysis of sensing performance with PSHE (Conventional weak measurements)

Figure 4 shows the simulated variation of initial SDS (δH) with θ in the optical structure corresponding to a TM1 mode for d4 = 20 µm and when B = 0 T. Figure 4 contains the SDS vs. θ curves for two values of n4 (1 and 1.1 RIU). For n4 = 1, the maximum of SDS (δH) = 1416.302 µm at θ = 14.1293°. The maximum of δH becomes 1101.629 µm at θ = 15.4731° for n4 = 1.1 RIU. Thus, the RI sensitivity at B = 0 T is [δH (n4 = 1) − δ-H (n4 = 1.1)]/δna = 3146.735 µm/RIU.

Fig. 4.

Fig. 4

Variation of initial SDS (δH) with incident angle θ in optical structure corresponding to a TM1 single mode for d4 = 20 µm, n4 = 1, n4 = 1.1 and B = 0 T

Extending the analysis for a structure with d4 = 100 µm, n4 = 1, B = 0 T and a TM3 mode, it is observed that the maximum of δ-H is 544.728 µm at θ = 6.3780° for n4 = 1 RIU, which changes to 699.602 µm at θ = 9.1980° for n4 = 1.1 RIU. These values indicate that the RI sensitivity for this very structure is 1548.74 µm/RIU, which is smaller than the sensitivity (3146.735 µm/RIU) discussed above.

As discussed in the previous sections, it is also possible to resort to an amplified SDS in order to seek an improvement in the sensing performance of the concerned PSHE structure. In this context, Fig. 5 shows the variation of amplified SDS, i.e., AδH (for n4 = 1 and for n4a = 1.1) with θ for a TM mode in conventional weak measurements (Δ = 0.1°) corresponding to B = 0 T.

Fig. 5.

Fig. 5

Variation of amplified SDS (AδH) with incident angle θ in optical structure corresponding to a TM1 single mode in conventional weak measurements (Δ = 0.1°) for d4 = 20 µm, n4 = 1, n4 = 1.1 and B = 0 T

Above plots indicate that the peak value of AδH at n4 = 1 is 3.87 × 1010 µm and it corresponds to θ = 14.1293°. Similarly, the peak value of AδH at n4a = 1.1 is 3.01 × 1010 µm (at θ = 15.473°). Thus, sensitivity is 8.60 × 1010 µm/RIU and corresponding resolution is 2.32 × 10−12 RIU.

Analyzing the magnetic field sensing, it is found that AδH = 3.83 × 1010 µm (at θ = 14.1301°) for B = 1 T and n4 = 1. Thus, the magnetic field sensitivity turns out to be 3.77 × 102 µm/µT (ΔB = 1 T) while the corresponding resolution is 5.31 × 10−4 µT.

For another structure with d4 = 100 µm, n4 = 1, B = 0 T, Δ = 0.1° and a TM3 mode, in conventional weak measurements, the peak value of AδH is 1.49 × 1010 µm at θ = 6.3780°. The peak value of AδH becomes 1.91 × 1010 µm (at θ = 9.1980°) for n4 = 1.1. Thus, sensitivity is 4.23 × 1010 µm/RIU and corresponding resolution is 4.72 × 10−12 RIU. For B = 1 T and n4 = 1, AδH = 1.50 × 1010 µm. Thus, the magnetic field sensitivity turns out to be 1.45 × 102 µm/µT (ΔB = 1 T) while the corresponding resolution is 1.38 × 10−3 µT.

Analysis of sensing performance with PSHE (Modified weak measurements)

A similar analysis is carried out for the amplified SDS, i.e., AδH (for n4 = 1 and n4a = 1.1) with θ for a TM1 mode (Fig. 6) under modified weak measurements (Δ = 0.1°) corresponding to B = 0 T. The corresponding maximum values of AδH are 2.11 × 105 µm (at θ = 14.1594° for n4 = 1) and 1.82 × 105 µm (at θ = 15.5225° for n4a = 1.1). Thus, sensitivity is 2.86 × 105 µm/RIU and corresponding resolution is 6.99 × 10−7 RIU. For B = 1 T and n4 = 1, AδH = 2.10 × 105 µm (at θ = 14.1605°). Thus, the magnetic field sensitivity is 1.07 × 10−4 µm/µT (δB = 1 T) while the corresponding resolution is 1.87 × 103 µT = 1.87 mT.

Fig. 6.

Fig. 6

Variation of amplified SDS (AδH) with incident angle θ in optical structure corresponding to a TM1 single mode in modified weak measurements (Δ = 0.1°) for d4 = 20 µm, n4 = 1, n4 = 1.1 and B = 0 T

For another structure with d4 = 100 µm, n4 = 1, B = 0 T, Δ = 0.1° and a TM3 mode, in modified weak measurements, the maximum value of AδH is 5.49 × 108 µm (at θ = 6.3621° for n4 = 1) and 4.06 × 108 µm (at θ = 9.1713° for n4a = 1.1). Thus, sensitivity is 1.44 × 109 µm/RIU and corresponding resolution is 1.39 × 10−10 RIU.

For B = 1 T and n4 = 1, AδH = 5.43 × 108 µm, which leads to a magnetic field sensitivity is 6.3941 µm/µT (ΔB = 1 T) while the corresponding resolution is 3.13 × 10−2 µT = 3.13 × 10−5 mT.

Table 3 summarizes the values of Snc (µm/RIU), Rnc (RIU) with the conventional weak measurements and Snm (µm/RIU), Rnm (RIU) with the modified weak measurements for a TM1 mode when d4 is varied between1.2 µm and 30 µm. The same table also contains the corresponding values for a TM3 mode when d4 = 100 µm, and for a TM6 mode when d4 = 200 µm for Δ = 0.1° and B = 0 T.

Table 3.

Values of Snc (µm/RIU) and Rnc (RIU) with the conventional weak measurements, and Snm (µm/RIU) and Rnm (RIU) with the modified weak measurements for a TM1 mode when d4 is 1.2 µm, 10 µm, 20 µm, 30 µm, for a TM3 mode when d4 = 100 µm and for a TM6 mode when d4 = 200 µm for Δ = 0.1° and B = 0 T

Mode d4 Snc Rnc Snm Rnm
TM1 1.2 2.76 × 1012 7.26 × 10−14 1.16 × 104 1.73 × 10−5
TM1 10 1.78 × 1011 1.12 × 10−12 7.33 × 104 2.73 × 10−6
TM1 20 8.60 × 1010 2.32 × 10−12 2.86 × 105 6.99 × 10−7
TM1 30 5.42 × 1010 3.69 × 10−12 6.99 × 105 2.86 × 10−7
TM3 100 4.23 × 1010 4.72 × 10−12 1.44 × 109 1.39 × 10−10
TM6 200 4.19 × 1010 4.77 × 10−12 5.80 × 109 3.45 × 10−11

Table 3 shows that for larger value of d4, the Snc decreases while Snm increases. This, in effect, leads to achieve finer resolution of RI measurement for smaller d4 with PSHE under conventional weak measurements. On the other hand, the finer RI resolution is achieved for larger d4 with PSHE under modified weak measurements.

In this sequence, Table 4 enlists the values of sensitivity SBc (µm/µT), and resolution RBc (µT) with the conventional weak measurements and SBm (µm/µT), RBm (µT) with the modified weak measurements of magnetic field for a TM1 mode when d4 is varied between 1.2 µm and 20 µm. The same table also contains the corresponding values for a TM3 mode when d4 = 100 µm, and for a TM6 mode when d4 = 200 µm for Δ = 0.1° and n4 = 1.

Table 4.

Values of SBc (µm/µT), RBc (µT) with the conventional weak measurements and SBm (µm/µT), RBm (µT) with the modified weak measurements for a TM1 mode when d4 is 1.2 µm, 10 µm, 20 µm for a TM3 mode, when d4 = 100 µm and for a TM6 mode when d4 = 200 µm for Δ = 0.1° and n4 = 1

Mode d4 SBc RBc SBm RBm
TM1 1.2 4.04 × 104 4.96 × 10−6 8.05 × 106 2.48 × 10−4
TM1 10 8.31 × 102 2.41 × 10−4 3.67 × 105 5.45 × 10−3
TM1 20 3.77 × 102 5.31 × 10−4 1.07 × 104 1.87 × 10−3
TM3 100 1.46 × 102 1.38 × 10−3 6.39 3.13 × 10−2
TM6 200 1.42 × 102 1.41 × 10−3 25.4 7.86 × 10−3

Table 4 indicates that for larger value of d4, the SBc decreases while SBm increases. This, in effect, leads to achieve finer resolution of magnetic field measurement for smaller d4 with PSHE under conventional weak measurements. On the other hand, the finer magnetic field resolution is achieved for larger d4 with PSHE under modified weak measurements.

From Tables 3 and 4, it is also apparent that a higher order mode (e.g., TM6) is favorable for achieving greater sensitivity and finer resolution of magnetic field under the modified weak measurements.

Influence of variation in Δ along with TM mode order and d4 on sensing performance

We have also simulated other different variants (in terms of extended variations in Δ along with above-discussed sets of TM modes and d4) of the proposed sensor design in order to check if these variants can bring any improvement in the sensor’s resolution for RI and magnetic field measurements. These results have been listed in Table 5.

Table 5.

Performance parameters for different variants of sensor design

Mode Range of n4 d4 (µm) Δ (in o) Resolution, Rn1 (RIU) with conventional measurement Resolution, Rn2 (RIU) with modified measurement Remarks
RI Sensing (B = 0 T)
TM1 1–1.1 20 36.96 1.00 × 10−9 1.62 × 10−9 Rn1 and Rn2 are very close to each other in terms of their order
TM3 1–1.1 100 0.66 3.12 × 10−11 2.10 × 10−11 Rn1 and Rn2 are two orders finer than those for TM1 mode
Mode Range of B d4 (µm) Δ (in o) Resolution, RB1 (µT) with conventional measurement Resolution, RB2 (µT) with modified measurement Remarks
Magnetic field sensing (n4 = 1)
TM1 0–1 T 20 74 1.06 0.97 RB1 and RB2 are very close to each other
TM3 0–1 T 100 0.50 0.007 0.006 RB1 and RB2 are 2 orders finer than those for TM1 mode

The above values indicate that apart from preferring higher order of TM mode and large value of d4, smaller values of Δ can further help in achieving even finer resolutions of both RI and magnetic field measurements. However, the above values of resolution are either comparable or inferior to those listed in previous tables. Nevertheless, the above influence of Δ on sensing performance provides another degree of freedom as far as the sensor design is concerned.

Conclusions

The results indicate that using the transverse SDS of the horizontal PSHE in a graphene- and germanium-based plasmonic sensor in THz frequency region, one may achieve very fine resolution for measurement of RI of a gas medium while magnetic field being applied to the graphene monolayer. A few salient points related to RI and magnetic field sensing are:

RI Sensing

  • In the conventional weak measurements with TM1 mode, d4 = 20 µm, B = 0 T, and Δ = 0.1°, an RI resolution of as fine as 2.32 × 10−12 RIU is achievable for gaseous medium in the range 1–1.1 RIU.

  • In the modified weak measurements with TM3 mode, d4 = 100 µm, B = 0 T, and Δ = 0.1°, an RI resolution of 1.39 × 10−10 RIU is achievable for gaseous medium in the range 1–1.1 RIU.

Magnetic field sensing

  • In the conventional weak measurements with TM1 mode, d4 = 20 µm, n4 = 1, and Δ = 0.1°, a magnetic field resolution of 5.31 × 10−4 µT is achievable for the magnetic field in the range 0–1 T.

  • In the modified weak measurements with TM6 mode, d4 = 200 µm, n4 = 1, and Δ = 0.1°, a magnetic field resolution of 7.86 × 10−3 µT is achievable for the magnetic field in the range 0–1 T.

With larger value of d4, the FOM of the plasmonic sensor (without PSHE measurement) increases. Also, the smaller d4 leads to finer resolutions of RI and magnetic field with PSHE under conventional weak measurements. This trend reverses with PSHE under modified weak measurements for which larger d4 leads to finer resolutions of RI and magnetic field (Tables 2, 3 and 4).

The amplified angle Δ can further help in achieving even finer resolutions of both RI and magnetic field particularly under modified weak measurements. (Table 5).

Some of the results discussed above are better or comparable with the existing (5 × 10−9 RIU and 0.7 µT or 1.22 × 10−11 RIU and 1.46 × 10−2 µT) values for a structure with four layers in the conventional weak measurement [1–3]. This study further consolidates that PSHE-based plasmonic sensor design in THz frequency can be extremely apt candidate for highly sensitive and accurate measurements of RI and magnetic field.

As far as the repeatability of this sensor design is concerned, the testing cycles of this structure should be conducted with a constant exposure and a introduction of the concerned gaseous medium (e.g., n4 = 1.1) for few minutes. During the exposure of gases (angle θ should be fixed at particular value), the power loss magnitude will change significantly. In the next step, when the sensor is operated with air (n4 = 1), the power loss of the sensor will shift back to its initial value. This will confirm the repeatability of the sensing device where its power loss value shift according to the RI of the gaseous medium and acquire its initial value when again its exposed with air. The similar explanation holds for variable magnetic field also.

Acknowledgements

Anuj K. Sharma (Principal Investigator), Y. K. Prajapati (Co-Principal Investigator), and Kinjal Chauhan (Research staff) gratefully acknowledge the core research grant (Project no.: CRG/2019/002636) from Science and Engineering Research Board (SERB) India that fully funded this research work.

Data availability

The datasets generated during and/or analysed during the current study are available from the corresponding author on reasonable request.

Declarations

Conflict of interest

The authors declare no conflict of interest.

Footnotes

Publisher's Note

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Associated Data

This section collects any data citations, data availability statements, or supplementary materials included in this article.

Data Availability Statement

The datasets generated during and/or analysed during the current study are available from the corresponding author on reasonable request.


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