AFM	Atomic force microscopy
SPM	Scanning probe microscopy
STM	Scanning tunneling microscopy
TERS	Tip-enhanced Raman spectroscopy
SVM	Scanning voltage microscopy
SThM	Scanning thermal microscopy
PiFM	Photo-induced Force Microscopy
PC/CAFM	Photoconductive/Conductive Atomic Force Microscopy
SSRM	Scanning spreading resistance microscopy
AM	Amplitud modulation
PM	Phase modulation
FM	Frequency modulation
KPFM	Kelvin probe force microscopy
PFT	Peak force tapping
PFM	Piezoresponse force microscopy
PFQNM	Peak force quantitative nanomechanics
SCM	Scanning capacitance microscopy
SMM	Scanning microwave microscopy
EFM	Electrostatic force microscopy
MFM	Magnetic Force Microscopy
CFM	Chemical force microscopy
c-PTIR	Contact-mode photo-thermal induced resonance
s-SNOM	Scattering-type scanning near-field optical microscopy
nano-FTIR	Nanoscale Fourier Transformation Infrared Spectroscopy
FluidFM	Fluid force microscopy
SPL	Scanning probe lithography
SICM	Scanning Ion Conductance microscopy
SECM	Scanning electrochemical microscopy
LFM	Lateral force microscopy
FFM	Friction force microscopy
HSAFM	High-speed atomic force microscopy
SMFS	Single molecule force spectroscopy
SCFS	Single-cell force spectroscopy