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. 2022 Dec 8;23(24):15529. doi: 10.3390/ijms232415529

Figure 3.

Figure 3

SEM images of Cu-doped Sb2Se3 thin films deposited by LT-PED on Mo substrate: (a) a surface roughness comparison for samples deposited with different accelerating voltages; (b) a higher magnification of the sample deposited at 16 kV; and (c) a higher magnification of the sample surface deposited at 18 kV.