Fig. 2.

x-z cross section of a ξ stack obtained from simulated (a) and experimental (b) data. (c) x-z cross section of associated fluorescence image stack. (d-e) Line profiles along the vertical and horizontal dashed lines in (a)-(c). (f) Convolution model relating ξ and ξ0. Scale bar in (a)-(c): 100 μm.