| EXAFS | Extended X-Ray Absorption Fine Structure |
| SEXAFS | Surface Extended X-Ray Absorption Fine Structure |
| NEXAFS: | Near Edge X-Ray Absorption Fine Structure |
| XPS | X-Ray Photoelectron Spectroscopy |
| NAP-XPS | Near Ambient Pressure X-Ray Photoelectron Spectroscopy |
| UPS | Ultraviolet Photoelectron Spectroscopy |
| LEED | Low-Energy Electron Diffraction |
| AES | Auger Electron Spectroscopy |
| HR/-EELS | High-Resolution/Electron Energy-Loss Spectroscopy |
| ISS/RBS | Ion Scattering-Rutherford Backscattering Spectroscopy |
| FT-IR and Raman | Fourier Transform Infrared and Raman Spectroscopy |
| NMR | Nuclear Magnetic Resonance |
| LEEM | Low-Energy Electron Microscopy |
| XPEEM | X-ray photoemission electron Microscopy |
| UV-VIS | Ultraviolet–Visible Light Spectroscopy |
| CL/PL | Cathodoluminescence-Photoluminescence |
| XRF | X-Ray Fluorescence |
| EDS | Energy-Dispersive X-Ray Spectroscopy |
| SEM | Scanning Electron Microscopy |
| (GI)-XRD | (Grazing Incidence-) X-Ray Diffraction |
| TP(X) | Temperature Programmed (X:Reduction-Oxidation) |