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. 2022 Dec 20;23(1):29. doi: 10.3390/s23010029
EXAFS Extended X-Ray Absorption Fine Structure
SEXAFS Surface Extended X-Ray Absorption Fine Structure
NEXAFS: Near Edge X-Ray Absorption Fine Structure
XPS X-Ray Photoelectron Spectroscopy
NAP-XPS Near Ambient Pressure X-Ray Photoelectron Spectroscopy
UPS Ultraviolet Photoelectron Spectroscopy
LEED Low-Energy Electron Diffraction
AES Auger Electron Spectroscopy
HR/-EELS High-Resolution/Electron Energy-Loss Spectroscopy
ISS/RBS Ion Scattering-Rutherford Backscattering Spectroscopy
FT-IR and Raman Fourier Transform Infrared and Raman Spectroscopy
NMR Nuclear Magnetic Resonance
LEEM Low-Energy Electron Microscopy
XPEEM X-ray photoemission electron Microscopy
UV-VIS Ultraviolet–Visible Light Spectroscopy
CL/PL Cathodoluminescence-Photoluminescence
XRF X-Ray Fluorescence
EDS Energy-Dispersive X-Ray Spectroscopy
SEM Scanning Electron Microscopy
(GI)-XRD (Grazing Incidence-) X-Ray Diffraction
TP(X) Temperature Programmed (X:Reduction-Oxidation)